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Updated: Jun 10, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
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Shifted angular spectrum method for off-axis numerical propagation

Kyoji Matsushima1

  • 1Department of Electrical and Electronic Engineering, Kansai University, 3-3-35 Yamate-cho, Suita, Osaka 564-8680, Japan. matsu@kansai-u.ac.jp

Optics Express
|August 20, 2010
PubMed

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