Related Experiment Video

Updated: Jun 10, 2026

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
10:28

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

Published on: July 5, 2016

Phase-stepping holographic moiré: simultaneous in-plane and out-of-plane displacement measurement

E S Simova, K N Stoev

    Applied Optics
    |August 21, 2010
    PubMed

    Abstract:

    A new use for the phase-stepping technique in holographic moiré is demonstrated. The method has the advantage of providing instantaneous determination of in-plane and out-of-plane displacements without the necessity for auxiliary carrier fringes.

    More Related Videos

    Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes
    06:56

    Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes

    Published on: May 23, 2017

    Time Multiplexing Super Resolving Technique for Imaging from a Moving Platform
    06:25

    Time Multiplexing Super Resolving Technique for Imaging from a Moving Platform

    Published on: February 12, 2014

    Related Experiment Videos

    Last Updated: Jun 10, 2026

    Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
    10:28

    Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

    Published on: July 5, 2016

    Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes
    06:56

    Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes

    Published on: May 23, 2017

    Time Multiplexing Super Resolving Technique for Imaging from a Moving Platform
    06:25

    Time Multiplexing Super Resolving Technique for Imaging from a Moving Platform

    Published on: February 12, 2014

    Related Concept Videos

    Phase Contrast and Differential Interference Contrast Microscopy01:26

    Phase Contrast and Differential Interference Contrast Microscopy

    Phase-Contrast Microscopes
    In-phase-contrast microscopes, interference between light directly passing through a cell and light refracted by cellular components is used to create high-contrast, high-resolution images without staining. It is the oldest and simplest type of microscope that creates an image by altering the wavelengths of light rays passing through the specimen. Altered wavelength paths are created using an annular stop in the condenser. The annular stop produces a hollow cone of...

    Articles linked to this work by shared authors, journal, and citation graph.

    Silver-halide sensitized gelatin derived from Agfa-Gevaert holographic plates.

    Applied optics·2010

    Phase-stepping automatic fringe analysis in holographic moiré.

    Applied optics·2010

    Design and validation of a high-efficiency RF amplifier for acousto-optic spectrometers.

    Applied optics·2026

    Non-volatile reflective displays based on ultrathin GeTe phase-change layers.

    Applied optics·2026

    Multi-view consistent 3D light-field-driven display method for dynamic digital humans.

    Applied optics·2026

    High-bandwidth tracking control for visual servo gimbals using phase-compensated Youla parameterization with time delay.

    Applied optics·2026

    High-temperature reliability of AlGaN deep-UV light-emitting diodes for extreme environments.

    Applied optics·2026

    Numerical study of a tunable graphene terahertz absorber with an asymmetric ring-comb metasurface.

    Applied optics·2026

    Enhanced Roughness-Matching Precision for Random Grating Textures at a 1.0-mm Mean Wavelength.

    IEEE transactions on haptics·2026

    Polarization-constrained ring-illumination microscopy for label-free relative 3D surface reconstruction.

    Optics letters·2026

    Ray-resampling geometric distortion correction for imaging systems.

    Optics letters·2026

    Data-driven spatial reference construction for deviation magnification of complex edge structures.

    Applied optics·2026

    Small-diameter pipeline panoramic measurement system based on dual-view acquisition and valid information recovery.

    Applied optics·2026
    See all related articles
    JoVE
    x logofacebook logolinkedin logoyoutube logo
    ABOUT JoVE
    OverviewLeadershipBlogJoVE Help Center
    AUTHORS
    Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
    LIBRARIANS
    TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
    RESEARCH
    JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
    EDUCATION
    JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
    Terms & Conditions of Use
    Privacy Policy
    Policies
    Jove
    Visualize
    Contact Us