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Updated: Jun 10, 2026

06:56
Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes
Published on: May 23, 2017
Two-wavelength electronic speckle-pattern interferometry for the analysis of discontinuous deformation fields
Applied Optics
|August 21, 2010
Abstract:
Ambiguity in the conversion of phase measurements to deformation values restricts the applicability of electronic speckle-pattern interferometry. The use of two wavelengths greatly relaxes this restriction.
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