Design of an aberration corrected low-voltage SEM

R H van Aken1, D J Maas, C W Hagen

  • 1Delft University of Technology, Department of Applied Physics, Charged Particle Optics Group, Lorentzweg 1, 2628CJ Delft, The Netherlands.

Ultramicroscopy
|August 24, 2010
PubMed