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Nanomoulding of Functional Materials, a Versatile Complementary Pattern Replication Method to Nanoimprinting
Published on: January 23, 2013
Photocurable silsesquioxane-based formulations as versatile resins for nanoimprint lithography
Bong Kuk Lee1, Nam-Goo Cha, Lan-Young Hong
1The Institute of Scientific and Industrial Research, Osaka University, 8-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan.
Langmuir : the ACS Journal of Surfaces and Colloids
|August 25, 2010
Summary
Methacrylate octafunctionalized silsesquioxane (SSQMA) is a high-performance material for ultraviolet (UV)-based nanoimprint lithography (NIL). Its formulations offer excellent imprint fidelity, high aspect ratio nanostructure replication, and durability for various NIL processes.
Area of Science:
- Materials Science
- Nanotechnology
- Polymer Chemistry
Background:
- Nanoimprint lithography (NIL) requires advanced materials for high-resolution pattern replication.
- Developing functional imprint materials with tailored properties is crucial for NIL advancements.
Purpose of the Study:
- To evaluate methacrylate octafunctionalized silsesquioxane (SSQMA) as a high-performance material for UV-based NIL and step-and-flash imprint lithography (SFIL).
- To characterize the physical and chemical properties of SSQMA-based formulations for NIL applications.
Main Methods:
- Formulation of SSQMA with acrylic additives to achieve desired viscosity (0.8–50 cP).
- Evaluation of cured SSQMA properties: volumetric shrinkage, Young's modulus, plasma resistance, UV transparency, and media resistance.
- Replication of nanostructures using UV-NIL and SFIL techniques with SSQMA-based resins.
- Assessment of mold and replica fidelity, feature size reproduction (down to 50 nm), and durability over multiple imprinting cycles.
Main Results:
- SSQMA formulations exhibited low shrinkage (4%), high Young's modulus (2.445–4.272 GPa), and excellent resistance to plasma and media.
- High-aspect-ratio nanostructures (up to 4.5) and sub-50-nm features were successfully reproduced using UV-NIL and SFIL.
- Replicated structures showed excellent imprint fidelity and minimal residual thickness.
- SSQMA-based resins demonstrated durability over 20 imprinting cycles without collapse or contamination.
Conclusions:
- SSQMA is an ideal functional imprint material for UV-based NIL and SFIL due to its favorable properties.
- The material enables cost-effective and reliable fabrication of high-resolution nanostructures.
- SSQMA-based resins are suitable for various physical contact NIL processes.

