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Super-resolution Fluorescence Microscopy01:37

Super-resolution Fluorescence Microscopy

Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been developed.
Double Resonance Techniques: Overview01:12

Double Resonance Techniques: Overview

Double resonance techniques in Nuclear Magnetic Resonance (NMR) spectroscopy involve the simultaneous application of two different frequencies or radiofrequency pulses to manipulate and observe two distinct nuclear spins. One important application of double resonance is spin decoupling, which selectively suppresses coupling with one type of nucleus while observing the NMR signal from another nucleus, simplifying the spectrum and enhancing resolution.
Spin decoupling is usually achieved by...

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Related Experiment Video

Updated: Jun 9, 2026

Real-Time, Two-Color Stimulated Raman Scattering Imaging of Mouse Brain for Tissue Diagnosis
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Published on: February 1, 2022

Surface profiling by means of double spectral modulation.

J E Calatroni, P Sandoz, G Tribillon

    Applied Optics
    |August 31, 2010
    PubMed
    Summary

    This study introduces a novel interferometric profilometry technique using double modulation of light. This method precisely measures surface profiles without needing piezoelectric transducers, adaptable for remote analysis.

    Area of Science:

    • Optics and Photonics
    • Metrology
    • Surface Science

    Background:

    • Interferometric profilometry is crucial for high-precision surface measurement.
    • Traditional methods often require complex setups and piezoelectric transducers for phase shifting.
    • Analyzing remote surfaces presents unique challenges in optical metrology.

    Purpose of the Study:

    • To propose a novel interferometric profilometry method utilizing double modulation of light.
    • To demonstrate high-precision surface profile measurement with simplified instrumentation.
    • To enable adaptable analysis of remote surfaces, including through optical fibers.

    Main Methods:

    • Double modulation of a light beam's power spectral distribution in both frequency and intensity.
    • Leveraging frequency modulation by path difference in interferometry.

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  • Utilizing intensity modulation by object transparency in a spectroscopic device.

    • Main Results:

    • Achieved high-precision surface profile measurement.
    • Demonstrated automatic phase shifting via continuous wavelength variation, eliminating the need for piezoelectric transducers.
    • Showcased adaptability for remote surface analysis via optical fibers.

    Conclusions:

    • The proposed double modulation technique offers a precise and simplified approach to interferometric profilometry.
    • The method's inherent phase shifting mechanism enhances its practical applicability.
    • Its adaptability through optical fibers broadens its potential use in various metrology applications.