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X-ray Diffraction of Biological Samples01:10

X-ray Diffraction of Biological Samples

X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
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Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
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D-stem: a parallel electron diffraction technique applied to nanomaterials.

K J Ganesh1, M Kawasaki, J P Zhou

  • 1Materials Science and Engineering, The University of Texas at Austin, 1 University Station, C2200, Austin, TX 78712, USA.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|September 1, 2010
PubMed
Summary
This summary is machine-generated.

A new technique called diffraction scanning transmission electron microscopy (D-STEM) allows for detailed electron diffraction analysis of nanostructures as small as 3 nm. This method enables simultaneous imaging and diffraction pattern acquisition for precise material characterization.

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Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles

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Area of Science:

  • Materials Science
  • Nanotechnology
  • Electron Microscopy

Background:

  • Characterizing nanostructures requires high-resolution imaging and diffraction techniques.
  • Conventional methods can be limited in their ability to obtain detailed diffraction information from very small nanoscale materials.

Purpose of the Study:

  • To develop and demonstrate a novel electron diffraction technique, D-STEM, for analyzing nanostructures.
  • To enable simultaneous imaging and diffraction pattern acquisition from nanoscale materials.

Main Methods:

  • Utilized a transmission electron microscopy/scanning transmission electron microscopy (TEM/STEM) instrument.
  • Configured pre- and postspecimen illumination lenses to create a 1-2 nm near-parallel probe.
  • Integrated with specialized software (GatanTM, DigistarTM, NanoMEGAS) for automated analysis.

Main Results:

  • Successfully obtained spot electron diffraction patterns from nanostructures as small as ~3 nm.
  • Achieved simultaneous bright-field/dark-field STEM imaging and sharp spot diffraction pattern recording.
  • Demonstrated automated orientation and phase mapping on a pixel-by-pixel basis.

Conclusions:

  • D-STEM is a powerful and versatile technique for the detailed characterization of various nanostructures.
  • The method allows for precise analysis of nanoparticles, nanowires, and nano interconnects.
  • Pixel-by-pixel diffraction analysis provides comprehensive crystallographic information.