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Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
Published on: January 26, 2016
Dynamic ellipsometry study on curved thin films at pendent droplet surfaces
1Institute of Chemistry and Chemical Engineering and Powder Metallurgy Research Institute, Central South University, Changsha 410083, People's Republic of China. yzhangcsu@mail.csu.edu.cn
The Review of Scientific Instruments
|September 7, 2010
Summary
This study presents a new apparatus for measuring dynamic thin film thickness and refractive index on curved droplet surfaces. The system enables continuous monitoring of surface tension and film properties.
Area of Science:
- Materials Science
- Surface Chemistry
- Optical Physics
Background:
- Investigating thin films on curved surfaces is challenging.
- Dynamic changes in film thickness and refractive index are crucial for understanding surface phenomena.
Purpose of the Study:
- To develop an apparatus for detecting dynamic thickness/refractive index changes of thin films on pendent droplet surfaces.
- To enable simultaneous monitoring of surface tension.
Main Methods:
- Integration of null ellipsometry and pendent drop shape analysis.
- Precise control of pendent droplet height to maintain laser beam lock.
- Dynamic investigation of film thickness and surface tension.
Main Results:
- Successful construction of an apparatus for dynamic thin film analysis.
- Capability to continuously monitor film thickness, refractive index, and surface tension.
- Demonstrated feasibility for studying dynamic processes on curved surfaces.
Conclusions:
- The developed apparatus offers a novel method for characterizing thin films on curved interfaces.
- This technique facilitates in-situ studies of dynamic surface phenomena.
- The system provides valuable insights into material behavior at curved interfaces.
