Return-path, multiple-principal-angle, internal-reflection ellipsometer for measuring IR optical properties of

R M A Azzam1

  • 1Department of Electrical Engineering, University of New Orleans,New Orleans, Louisiana 70148, USA. razzam@uno.edu

Applied Optics
|September 8, 2010
PubMed
Summary

This study introduces a novel retroreflection spectroscopic ellipsometer for measuring aqueous solution optical properties. The instrument enables detailed characterization of solid-liquid interfaces and thin films using attenuated internal reflection.

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