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Related Concept Videos

Electronic Distance Measuring Instruments01:30

Electronic Distance Measuring Instruments

Electronic Distance Measuring Instruments (EDMs) are essential tools in modern surveying, offering precise distance measurements by emitting electromagnetic signals and calculating the time required for these signals to travel to a target and return. Two primary types of signals are used in EDMs — light waves and microwaves — each suited to specific environmental and distance requirements. Light-wave-based EDMs utilize either infrared or laser light, providing high accuracy over short distances...
Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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Distance Measurements by Taping01:18

Distance Measurements by Taping

Tapes are essential in surveying for accurate, durable, and short-distance measurements. Made from lightweight, nylon-coated steel, they offer flexibility and strength for rugged outdoor use. The nylon coating protects against rust and wear, extending the tape's life. Standard lengths, around 30 meters, are marked in meters and millimeters for precision.Surveyors select tapes based on site conditions and accuracy needs. Lightweight, nylon-coated tapes are commonly used for ease of handling and...
Super-resolution Fluorescence Microscopy01:37

Super-resolution Fluorescence Microscopy

Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been developed.

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Related Experiment Video

Updated: Jun 8, 2026

Implementation of a Reference Interferometer for Nanodetection
16:11

Implementation of a Reference Interferometer for Nanodetection

Published on: April 26, 2014

Nanometer-resolution distance measurement with a noninterferometric method.

K L Deng, J Wang

    Applied Optics
    |September 24, 2010
    PubMed
    Summary
    This summary is machine-generated.

    We developed a new optical ranging method for high-resolution distance measurement. This technique achieves 20-nm resolution by precisely controlling laser wavelength with target feedback.

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    Last Updated: Jun 8, 2026

    Implementation of a Reference Interferometer for Nanodetection
    16:11

    Implementation of a Reference Interferometer for Nanodetection

    Published on: April 26, 2014

    Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes
    06:56

    Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes

    Published on: May 23, 2017

    Area of Science:

    • Optics and Photonics
    • Metrology
    • Laser Physics

    Background:

    • Accurate distance measurement is crucial in various scientific and industrial fields.
    • Traditional optical ranging methods often rely on interferometry, which can be complex.
    • Developing non-interferometric techniques offers potential advantages in simplicity and robustness.

    Purpose of the Study:

    • To introduce a novel non-interferometric technique for high-resolution distance measurement.
    • To demonstrate the feasibility of achieving nanometer-scale resolution in optical ranging.
    • To explore the use of external feedback for precise laser wavelength control in metrology.

    Main Methods:

    • Utilized a broadband continuous-wave (cw) laser whose wavelength is modulated by external feedback.
    • Integrated a microscope objective to position the ranging target near its focal point, enhancing position sensitivity.
    • Monitored changes in laser wavelength to determine target position with high precision.

    Main Results:

    • Achieved a distance measurement resolution of 20 nanometers (nm).
    • Demonstrated that target position can be accurately determined from laser wavelength variations.
    • Identified instrumental resolution and mechanical stability as key factors limiting performance.

    Conclusions:

    • The developed non-interferometric optical ranging technique offers high resolution for distance measurement.
    • External feedback control of laser wavelength provides a sensitive method for metrology.
    • Further improvements in instrumentation and stability can potentially enhance the achieved resolution.