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Updated: Jun 8, 2026
09:20
Near Simultaneous Laser Scanning Confocal and Atomic Force Microscopy (Conpokal) on Live Cells
Published on: August 11, 2020
Semiconductor laser confocal microscopy
Applied Optics
|September 24, 2010
Abstract:
A compact scanning microscope that uses a semiconductor laser both to illuminate a specimen and to detect the signal reflected from it is described. It is demonstrated that the spatial filtering performed by the laser detector ensures confocal operation. Two detection regimes, one employing a laser power monitor and the other using the diode junction voltage as a signal, are compared.
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