Relationships between speed and tolerances for self-electro-optic-effect devices

Area of Science:

• Optoelectronics
• Photonics
• Device Physics

Background:

• Self-electro-optic-effect devices (SEEDs) are crucial for optical computing.
• Understanding SEEDs' performance under varying optical power is essential for reliable system design.
• Previous research has explored SEED functionality but lacked detailed bit rate-tolerance calculations.

Purpose of the Study:

• To develop a method for calculating the relationship between system bit rates and optical power tolerances in SEEDs.
• To analyze the impact of optical power variations on the performance of high-contrast and differential SEEDs.
• To determine optimal power ratios for SEED logic nodes and shift registers and compare optoelectronic vs. optical SEED cascading.

Main Methods:

• Developed a calculation method to correlate system bit rates with optical power tolerances for SEEDs.
• Analyzed high-contrast-ratio and differential SEEDs under optical power variations.
• Calculated control-beam to signal-beam and transfer-beam to clock-beam power ratios for SEED switching nodes and shift registers.

Main Results:

• High-contrast-ratio SEEDs demonstrate improved bit rates when faced with optical power variations.
• The method successfully calculated power ratios for logic SEED switching nodes and shift registers.
• Optoelectronically cascaded SEED shift registers exhibit bit rates comparable to optically cascaded symmetric SEEDs.

Conclusions:

• The developed method provides a quantitative link between SEED bit rates and optical power tolerances.
• High-contrast SEEDs offer enhanced robustness against optical power fluctuations, crucial for practical applications.
• Optoelectronic cascading in SEEDs presents a viable alternative to optical cascading, achieving similar performance levels.