Related Experiment Video

Updated: Jun 8, 2026

X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells
10:16

X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells

Published on: August 20, 2019

Laboratory measurements of electrostatic solitary structures generated by beam injection

Bertrand Lefebvre1, Li-Jen Chen, Walter Gekelman

  • 1Space Science Center, University of New Hampshire, Durham, New Hampshire 03824, USA. bertrand.lefebvre@unh.edu

Physical Review Letters
|September 28, 2010
PubMed

More Related Videos

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments11:47

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Published on: February 27, 2013

Related Concept Videos

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...