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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

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Scanning transmission electron microscopy using selective high-order laue zones: three-dimensional atomic ordering in

F-T Huang1, A Gloter, M-W Chu

  • 1Laboratoire de Physique des Solides, Université Paris-Sud, CNRS-UMR 8502, Orsay, France.

Physical Review Letters
|September 28, 2010
PubMed

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