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Updated: Jun 8, 2026

13:58
Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
Published on: September 28, 2016
Scanning probe direct-write of germanium nanostructures
Jessica D Torrey1, Stephanie E Vasko, Adnan Kapetanovic
1Department of Materials Science and Engineering, University of Washington, Seattle, WA 98195, USA.
Advanced Materials (Deerfield Beach, Fla.)
|September 28, 2010
Summary
No abstract available in PubMed .
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