Related Experiment Video
Updated: Jun 8, 2026

Cortical Bone Assessment Using Ultrasonic Guided Waves: A Reproducibility Study in a Healthy Population
Published on: January 31, 2025
Damage characterization using guided-wave linear arrays and image compounding techniques
Ricardo T Higuti1, Oscar Martínez-Graullera, Carlos J Martín
1Universidade Estadual Paulista (UNESP), Department of Electrical Engineering, Ilha Solteira, São Paulo, Brazil. tokio@dee.feis.unesp.br
Abstract:
In this work, a high-resolution imaging method for the inspection of isotropic plate-like structures using linear arrays and Lamb waves is proposed. The evaluation of these components is limited by the low dynamic range resulting from main lobe and side lobe field patterns, and from the narrowband nature of the Lamb waves. Based on a full matrix array, synthetic aperture technique using all emitter-receiver combinations, different images from the same object are obtained by using different apodization coefficients, which are related to a trade-off between main lobe width and relative side lobe level. Several image compounding strategies have been tested and a new algorithm, based on apodization and polarity diversities between signals, is proposed. However, some effects, such as the dead zone close to the array and reverberations caused by interactions of the wavefront and defects, still limit the quality of the images. The use of spatial diversity, obtained by an additional array, introduces complementary information about the defects and improves the results of the proposed algorithm, producing high-resolution, high-contrast images. Experimental results are shown for a 1-mm-thick isotropic aluminum plate with artificial defects using linear arrays formed by 30 piezoelectric elements, with the low dispersion symmetric mode S0 at the frequency of 330 kHz.
More Related Videos
11:47Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments
Published on: February 27, 2013
05:57Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020