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Writing and Low-Temperature Characterization of Oxide Nanostructures
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Writing and Low-Temperature Characterization of Oxide Nanostructures

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A study on low temperature transport properties of independent double-gated poly-Si nanowire transistors

Wei-Chen Chen1, Horng-Chih Lin, Zer-Ming Lin

  • 1Department of Electronics Engineering, National Chiao Tung University, Hsinchu, Taiwan, Republic of China.

Nanotechnology
|September 30, 2010
PubMed

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