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Soft-x-ray damage to p-terphenyl coatings for detectors
Applied Optics
|October 2, 2010
Summary
The photoluminescent efficiency of p-terphenyl, used in soft-x-ray detectors, decreases with soft-x-ray exposure. This efficiency drop accelerates at higher photon energies, impacting detector performance.
Area of Science:
- Materials Science
- Photonics
- Detector Physics
Background:
- P-terphenyl is an organic phosphor utilized as a wavelength-converter in soft-x-ray detectors.
- Understanding its photoluminescent efficiency under operational conditions is crucial for detector reliability.
Purpose of the Study:
- To quantify the absolute photoluminescent efficiency of p-terphenyl.
- To investigate the impact of soft-x-ray fluence on this efficiency across a range of photon energies.
Main Methods:
- Absolute photoluminescent efficiency measurements were performed.
- Efficiency was assessed as a function of incident photon energy (36-191 eV).
- Changes in efficiency due to soft-x-ray fluence were systematically measured.
Main Results:
- The photoluminescent efficiency of p-terphenyl was measured across the 36-191 eV range.
- A significant drop in efficiency was observed as a function of soft-x-ray fluence.
- The rate of efficiency decrease intensified with increasing soft-x-ray photon energies.
Conclusions:
- Soft-x-ray exposure degrades the photoluminescent efficiency of p-terphenyl.
- Detector performance may be compromised over time due to radiation damage.
- Further research is needed to mitigate efficiency loss in soft-x-ray detector applications.
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