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Refractive-index profiling of planar gradient-index waveguides by phase-measuring microinterferometry.
Applied Optics
|October 2, 2010
Summary
A new phase-stepping microinterferometry method accurately profiles refractive-index in glass waveguides. This technique offers simple sample preparation and easy implementation for improved resolution.
Area of Science:
- Optics and Photonics
- Materials Science
- Waveguide Technology
Background:
- Planar waveguides are crucial optical components.
- Accurate refractive-index profiling is essential for waveguide characterization.
- Ion-exchange in glass is a common fabrication method for waveguides.
Purpose of the Study:
- To introduce a novel measurement technique for refractive-index profiling.
- To characterize planar waveguides fabricated by ion exchange in glass.
- To demonstrate the advantages of the proposed method.
Main Methods:
- Phase-stepping microinterferometry was employed.
- The technique was applied to waveguides fabricated by ion exchange in glass.
- Instrumental implementation and sample preparation were optimized.
Main Results:
- The proposed method achieved high accuracy in refractive-index profiling.
- Improved resolution was obtained compared to existing techniques.
- The technique demonstrated simplicity in sample preparation and instrumental setup.
Conclusions:
- The novel phase-stepping microinterferometry technique is effective for refractive-index profiling of ion-exchanged glass waveguides.
- The method offers practical advantages including ease of use and high performance.
- This technique provides a valuable tool for waveguide characterization and development.
