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A procedure to determine the optimum imaging parameters for atomic/molecular resolution frequency modulation atomic

Yoshihiro Hosokawa1, Kei Kobayashi, Noriaki Oyabu

  • 1Department of Electronic Science and Engineering, Kyoto University, Katsura, Kyoto 615-8510, Japan.

The Review of Scientific Instruments
|October 5, 2010
PubMed

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Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...