Note: Synchronized stress-strain measurements in dynamic loading at high pressure using D-DIA

A new data collection protocol for forced oscillation experiments using a multianvil high pressure device is reported. We derive the stress of the sample at high pressure and temperature from synchrotron x-ray diffraction that is synchronized with sample strain measurements from x-ray radiographs. This method yields stress directly from the sample rather than a stress proxy. Furthermore, the diffraction pattern yields useful information concerning time evolution of structurally related phenomena. Here we illustrate some of these possibilities with high pressure experimental data.