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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Related Experiment Video

Updated: Jun 8, 2026

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
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Published on: December 20, 2016

Preparation of microsphere tips for atomic force microscopy (AFM).

Marija Plodinec, Marko Loparic, Ueli Aebi

    Cold Spring Harbor Protocols
    |October 5, 2010
    PubMed
    Summary

    This protocol details creating spherical indenters for atomic force microscopy (AFM) to enable micrometer-scale imaging and mechanical testing. These prepared indenters offer a method for advanced nanoscale material characterization.

    Area of Science:

    • Materials Science
    • Nanotechnology
    • Biophysics

    Background:

    • Atomic Force Microscopy (AFM) is a powerful tool for nanoscale imaging and mechanical property measurement.
    • Standard AFM cantilevers often have sharp tips, limiting certain types of mechanical testing and imaging.
    • Developing specialized probes is crucial for expanding AFM capabilities.

    Purpose of the Study:

    • To describe a reliable protocol for fabricating spherical indenters for AFM.
    • To enable micrometer-scale imaging and mechanical testing using these spherical indenters.
    • To provide a method for researchers to prepare their own spherical AFM probes.

    Main Methods:

    • Fabrication involves attaching a borosilicate sphere to a tipless AFM cantilever.
    • A stereomicroscope with a micromanipulator is used for precise sphere manipulation and attachment.

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  • Thorough cleaning of spheres using absolute ethanol is performed before attachment to ensure surface integrity.

    • Main Results:

    • Successfully prepared spherical indenters suitable for AFM applications.
    • Demonstrated the utility of these indenters for micrometer-scale imaging.
    • Validated the use of spherical indenters for mechanical testing at the nanoscale.

    Conclusions:

    • The described protocol provides a straightforward method for creating spherical AFM indenters.
    • These custom spherical indenters enhance AFM capabilities for specific imaging and mechanical testing applications.
    • This technique facilitates advanced material characterization at the micrometer and nanoscale.