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Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam
Published on: July 26, 2014
Specimen preparation of porous Au for transmission electron microscopy using cryo ion-milling
1Institute for Materials Research, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan. tanabe@tagen.tohoku.ac.jp
Journal of Electron Microscopy
|October 7, 2010
Abstract:
Porous Au specimens suitable for transmission electron microscopic investigations were prepared by the Ar ion-milling equipped with a cryo-system. The cryo technique enabled the preparation of an artifact-free specimen, avoiding the deposition of Au particles induced by ion-milling. This result demonstrates that cooling is necessary for defect-free preparation of the specimens.
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