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Related Concept Videos

Interference: Path Lengths01:10

Interference: Path Lengths

Consider two sources of sound, that may or may not be in phase, emitting waves at a single frequency, and consider the frequencies to be the same.
Two special sources may be considered when they are in phase. This can be easily achieved by feeding the two sources from the same source. An example would be synchronizing the two speakers by feeding them with the same source, such as the sound waves produced by a tuning fork. This setup ensures that the two sources have the same frequency and are...
Electronic Distance Measuring Instruments01:30

Electronic Distance Measuring Instruments

Electronic Distance Measuring Instruments (EDMs) are essential tools in modern surveying, offering precise distance measurements by emitting electromagnetic signals and calculating the time required for these signals to travel to a target and return. Two primary types of signals are used in EDMs — light waves and microwaves — each suited to specific environmental and distance requirements. Light-wave-based EDMs utilize either infrared or laser light, providing high accuracy over short distances...
Uncertainty in Measurement: Reading Instruments02:46

Uncertainty in Measurement: Reading Instruments

Counting is the type of measurement that is free from uncertainty, provided the number of objects being counted does not change during the process. Such measurements result in exact numbers. By counting the eggs in a carton, for instance, one can determine exactly how many eggs are there in the carton. Similarly, the numbers of defined quantities are also exact. For example, 1 foot is exactly 12 inches, 1 inch is exactly 2.54 centimeters, and 1 gram is exactly 0.001 kilograms. Quantities...
Uncertainty in Measurement: Accuracy and Precision03:37

Uncertainty in Measurement: Accuracy and Precision

Scientists typically make repeated measurements of a quantity to ensure the quality of their findings and to evaluate both the precision and the accuracy of their results. Measurements are said to be precise if they yield very similar results when repeated in the same manner. A measurement is considered accurate if it yields a result that is very close to the true or the accepted value. Precise values agree with each other; accurate values agree with a true value.
Inductively Coupled Plasma-Mass Spectrometry (ICP-MS): Interferences01:20

Inductively Coupled Plasma-Mass Spectrometry (ICP-MS): Interferences

Inductively coupled plasma–mass spectrometry (ICP–MS) is a highly selective and sensitive technique for accurate elemental analysis. Though the analysis of ICP–MS mass spectra is comparatively straightforward, it is affected by spectroscopic and non-spectroscopic interferences. Spectroscopic interferences arise when the plasma contains ionic species with an m/z value the same as the analyte ion. Spectroscopic interference can be categorized as isobaric, polyatomic ions, and refractory oxide ion...
Phase Contrast and Differential Interference Contrast Microscopy01:26

Phase Contrast and Differential Interference Contrast Microscopy

Phase-Contrast Microscopes
In-phase-contrast microscopes, interference between light directly passing through a cell and light refracted by cellular components is used to create high-contrast, high-resolution images without staining. It is the oldest and simplest type of microscope that creates an image by altering the wavelengths of light rays passing through the specimen. Altered wavelength paths are created using an annular stop in the condenser. The annular stop produces a hollow cone of...

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Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes
06:56

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes

Published on: May 23, 2017

Phase-measuring interferometry: new methods and error analysis.

C Joenathan

    Applied Optics
    |October 12, 2010
    PubMed
    Summary
    This summary is machine-generated.

    New phase-stepping interferometry methods enhance accuracy by reducing errors from phase stepper miscalibration and nonlinearity. These algorithms can also detect such instrumental imperfections.

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    Last Updated: Jun 8, 2026

    Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes
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    Published on: May 23, 2017

    The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry
    12:14

    The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry

    Published on: August 12, 2013

    Implementation of a Reference Interferometer for Nanodetection
    16:11

    Implementation of a Reference Interferometer for Nanodetection

    Published on: April 26, 2014

    Area of Science:

    • Optical Metrology
    • Interferometry
    • Phase Measurement

    Background:

    • Phase-stepping interferometry (PSI) is crucial for precise optical measurements.
    • Phase stepper miscalibration and nonlinearity introduce significant errors.
    • Accurate phase determination is essential for reliable metrology.

    Purpose of the Study:

    • To introduce novel methods for phase determination in PSI.
    • To develop algorithms for reducing errors caused by phase stepper imperfections.
    • To enable detection of phase stepper miscalibration and nonlinearity.

    Main Methods:

    • Development of new phase calculation algorithms for PSI.
    • Mathematical analysis of error propagation due to phase stepper miscalibration.
    • Implementation of algorithms to mitigate nonlinearity effects in phase retrieval.

    Main Results:

    • New methods successfully determine phase in PSI.
    • Combined algorithms effectively reduce errors from miscalibration and nonlinearity.
    • The proposed algorithms can identify the presence of phase stepper imperfections.

    Conclusions:

    • Novel phase determination techniques improve PSI accuracy.
    • Error reduction strategies enhance the robustness of interferometric measurements.
    • The developed algorithms offer a simplified understanding and mitigation of phase stepper errors.