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Related Concept Videos

IR Spectroscopy: Hooke's Law Approximation of Molecular Vibration01:16

IR Spectroscopy: Hooke's Law Approximation of Molecular Vibration

A covalently bonded heteronuclear diatomic molecule can be modeled as two vibrating masses connected by a spring. The vibrational frequency of the bond can be expressed using an equation derived from Hooke's law, which describes how the force applied to stretch or compress a spring is proportional to the displacement of the spring. In this case, the atoms behave like masses, and the bond acts like a spring.
According to Hooke's law, the vibrational frequency is directly proportional to the...
Mohr's Circle for Moments of Inertia: Problem Solving01:14

Mohr's Circle for Moments of Inertia: Problem Solving

Mohr's circle is a graphical method for determining an area's principal moments by plotting the moments and product of inertia on a rectangular coordinate system. This circle can also be used to calculate the orientation of the principal axes.
Consider a rectangular beam. The moments of inertia of the beam about the x and y axis are 2.5(107) mm4 and 7.5(107) mm4, respectively. The product of inertia is 1.5(107) mm4. Determine the principal moments of inertia and the orientation of the major and...
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Infrared (IR) Spectroscopy: Overview

When electromagnetic radiation passes through a material, atoms or molecules transition from a lower to a higher energy state by absorbing radiation corresponding to the energy difference between the two states. The absorption of infrared (IR) radiation causes transitions between vibrational energy levels in a molecule. Therefore, IR spectroscopy is a useful analytical tool for determining the molecular structure of molecules.
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UV–Vis Spectroscopy: Woodward–Fieser Rules01:29

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UV–Visible absorption spectra of conjugated dienes arise from the lowest energy π → π* transitions. The light-absorbing part of the molecule is called the chromophore, and the substituents directly attached to the chromophore are called auxochromes. A strong correlation exists between the absorption maxima, λmax, and the structure of a conjugated π system. The Woodward–Fieser rules predict the value of λmax for a given structure by adding the contributions...

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Related Experiment Video

Updated: Jun 8, 2026

Multimodal Nonlinear Hyperspectral Chemical Imaging Using Line-Scanning Vibrational Sum-Frequency Generation Microscopy
08:49

Multimodal Nonlinear Hyperspectral Chemical Imaging Using Line-Scanning Vibrational Sum-Frequency Generation Microscopy

Published on: December 1, 2023

Mueller matrix analysis of infrared ellipsometry.

E Wold, J Bremer

    Applied Optics
    |October 12, 2010
    PubMed
    Summary

    This study presents a Mueller analysis method to correct infrared ellipsometry data corrupted by imperfect optical components. The developed correction routines accurately remove systematic errors, improving permittivity measurements for materials like gold and strontium titanate.

    Area of Science:

    • Optical Physics
    • Materials Science
    • Spectroscopy

    Background:

    • Infrared (IR) ellipsometry is a powerful technique for characterizing material dielectric properties.
    • Imperfections in optical components can introduce systematic errors, compromising measurement accuracy.
    • Accurate permittivity determination is crucial for understanding and engineering material behavior.

    Purpose of the Study:

    • To develop and validate a Mueller analysis framework for correcting IR ellipsometry data.
    • To quantify and remove systematic errors arising from non-ideal optical elements.
    • To improve the reliability of permittivity measurements using IR ellipsometry.

    Main Methods:

    • A Mueller analysis was applied to IR ellipsometry data acquired with imperfect optical components.

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    Published on: January 26, 2016

  • Equations were derived to link experimental and calculated Fourier coefficients.
  • Correction routines were developed and demonstrated using gold and strontium titanate (SrTiO3) as examples.
  • Main Results:

    • Systematic errors, including interferometer polarization, detector dichroism, transmission, and polarizer phase changes, were successfully calculated and removed.
    • The derived correction routines effectively improved the accuracy of permittivity measurements.
    • Analysis of calibration issues and multiple reflections between polarizers provided insights into error propagation.

    Conclusions:

    • The Mueller analysis provides a robust method for correcting systematic errors in IR ellipsometry.
    • The developed correction routines enhance the precision of permittivity measurements, particularly for challenging samples.
    • This work offers a valuable tool for researchers utilizing IR ellipsometry in materials characterization.