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Laser-gain scanning microscopy: a new characterization technique for dopant engineered gain media
Jeff A Wisdom1, Romain M Gaume, Robert L Byer
1Coherent Inc., 5100 Patrick Henry Drive, Santa Clara, CA 95054, USA.
Optics Express
|October 14, 2010
Summary
We developed laser-gain scanning microscopy (LGSM) to map dopant profiles in laser materials. This optical technique accurately measures neodymium doping in YAG ceramics and identifies optical defects.
Area of Science:
- Materials Science
- Optical Engineering
- Spectroscopy
Background:
- Accurate mapping of dopant concentration is crucial for optimizing laser gain media performance.
- Existing physical methods like SIMS, XPS, and EMPA have limitations in correlating optical properties with doping profiles.
Purpose of the Study:
- To introduce and validate a novel optical technique, laser-gain scanning microscopy (LGSM), for mapping dopant concentration profiles.
- To demonstrate the capability of LGSM in characterizing engineered laser gain media.
Main Methods:
- Laser-gain scanning microscopy (LGSM) was employed to measure dopant concentration.
- The technique was applied to a transparent ceramic sample with a specific Nd(3+) concentration profile.
- LGSM results were compared with those obtained from Secondary Ion Mass Spectrometry (SIMS).
Main Results:
- LGSM successfully mapped the Nd(3+) concentration profile in the YAG transparent ceramic.
- LGSM measurements showed excellent agreement (within 5%) with SIMS data across a wide doping range (0.001 at.% to 0.9 at.%).
- LGSM demonstrated the unique ability to correlate optical defects with the final doping profile, a capability lacking in common physical methods.
Conclusions:
- LGSM is a high-performance optical technique for precise dopant profiling in laser gain media.
- LGSM offers advantages over traditional methods by integrating optical defect analysis with concentration mapping.
- This technique provides valuable insights for the design and fabrication of advanced laser materials.
