Pupil matching of Zernike aberrations

C E Leroux1, A Tzschachmann, J C Dainty

  • 1Applied Optics Group, School of Physics, National University of Ireland, Galway. charleleroux@yahoo.fr

Optics Express
|October 14, 2010
PubMed
Summary

Accurate optical system analysis requires comparing wavefront sensor measurements to known aberrations. This study introduces a Zernike expansion method to correct for alignment errors, improving measurement accuracy.