Related Experiment Video
Updated: Jun 8, 2026

04:54
A Stable Phantom Material for Optical and Acoustic Imaging
Published on: June 16, 2023
Optical-standard surfaces of single-crystal silicon for calibrating ellipsometers and reflectometers
Applied Optics
|October 14, 2010
Abstract:
We show that hydrogen-terminated (111) Si wafers prepared with NH(4)F-based treatments can serve as a calibration standard for ellipsometers and reflectometers.
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