Related Experiment Video
Updated: May 1, 2026

Single Particle Electron Microscopy Reconstruction of the Exosome Complex Using the Random Conical Tilt Method
Published on: March 28, 2011
New electrostatic phase plate for phase-contrast transmission electron microscopy and its application for
Katrin Schultheiss1, Joachim Zach, Bjoern Gamm
1Laboratorium für Elektronenmikroskopie, Karlsruher Institut für Technologie (KIT), D-76128 Karlsruhe, Germany. katrin.schultheiss@kit.edu
A new electrostatic phase plate for transmission electron microscopy (TEM) offers improved phase contrast imaging. This novel design enables object wave function reconstruction from just three images, advancing nanoscale imaging capabilities.
Area of Science:
- Physics
- Materials Science
- Electron Microscopy
Background:
- Traditional Boersch phase plates in transmission electron microscopy (TEM) face limitations due to their spatial frequency-blocking ring electrode.
- Developing advanced phase contrast techniques is crucial for high-resolution imaging of nanomaterials.
Purpose of the Study:
- To introduce and validate a novel electrostatic phase plate design for TEM.
- To demonstrate its capability in enhancing phase contrast and reconstructing object wave functions.
Main Methods:
- The study presents a new electrostatic phase plate utilizing a microcoaxial cable-like rod structure.
- Experimental phase-contrast images were acquired for lead selenide (PbSe) and platinum (Pt) nanoparticles.
- The phase shift was controlled by applied voltage, and object wave functions were reconstructed.
Main Results:
- The novel phase plate successfully generated clear phase contrast variations in images of PbSe and Pt nanoparticles.
- Phase contrast was demonstrably dependent on the applied voltage and the resulting phase shift of unscattered electrons.
- For the first time, an object wave function was reconstructed using only three phase-contrast TEM images from this new electrostatic phase plate.
Conclusions:
- The developed electrostatic phase plate overcomes limitations of previous designs, offering superior performance.
- This technology enables efficient object wave function reconstruction, significantly advancing TEM capabilities for nanoscale analysis.
Related Concept Videos
Phase Contrast and Differential Interference Contrast Microscopy
In-phase-contrast microscopes, interference between light directly passing through a cell and light refracted by cellular components is used to create high-contrast, high-resolution images without staining. It is the oldest and simplest type of microscope that creates an image by altering the wavelengths of light rays passing through the specimen. Altered wavelength paths are created using an annular stop in the condenser. The annular stop produces a hollow cone of...
Overview of Electron Microscopy
Transmission Electron Microscopy
Electron Microscope Tomography and Single-particle Reconstruction
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...

