Related Experiment Video
Updated: Jun 7, 2026

12:32
The Effect of Anodization Parameters on the Aluminum Oxide Dielectric Layer of Thin-Film Transistors
Published on: May 24, 2020
Highly stable transparent amorphous oxide semiconductor thin-film transistors having double-stacked active layers
Jae Chul Park1, Sangwook Kim, Sunil Kim
1Samsung Advanced Institute of Technology, Yongin, Korea.
Advanced Materials (Deerfield Beach, Fla.)
|October 26, 2010
Summary
No abstract available in PubMed .
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