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Updated: Jun 7, 2026
06:46
Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
The first experimental results from x-ray imaging crystal spectrometer for KSTAR
1National Fusion Research Institute, Daejeon 305-333, South Korea. sglee@nfri.re.kr
The Review of Scientific Instruments
|November 2, 2010
Summary
The Korea Superconducting Tokamak Advanced Research x-ray imaging crystal spectrometer (XICS) measures ion and electron temperatures using heliumlike argon spectra. Initial results show basic functions are working, though some satellite lines require further refinement.
Area of Science:
- Plasma physics
- Spectroscopy
Background:
- The Korea Superconducting Tokamak Advanced Research (KSTAR) utilizes advanced diagnostics for plasma analysis.
- Accurate temperature profile measurements are crucial for understanding tokamak plasma behavior.
Purpose of the Study:
- To report the initial application and performance of the x-ray imaging crystal spectrometer (XICS) on KSTAR.
- To assess the capability of XICS in measuring ion and electron temperature profiles using heliumlike argon spectra.
Main Methods:
- Deployment of the XICS diagnostic on the KSTAR tokamak.
- Acquisition and analysis of heliumlike argon (Ar XVII) spectra.
- Comparison of experimental spectral lines with theoretical predictions.
Main Results:
- The XICS system was successfully applied during the 2009 experimental campaign.
- The spectrometer demonstrated proper basic functionality for temperature profile measurements.
- Discrepancies were observed between experimental satellite line intensities and theoretical values.
Conclusions:
- The XICS is a functional diagnostic tool for KSTAR, providing valuable temperature profile data.
- Further calibration and analysis are needed to resolve discrepancies in satellite line measurements.
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