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Published on: March 31, 2022
Neural network approach to holographic nondestructive testing.
Applied Optics
|November 2, 2010
Summary
This study introduces a novel neural network method for automatic defect detection using holographic interference patterns. The approach demonstrates feasibility for holographic nondestructive testing, offering a new strategy for component inspection.
Area of Science:
- Optical Engineering
- Artificial Intelligence
- Materials Science
Background:
- Holographic interferometry is a powerful technique for nondestructive testing (NDT) of technical components.
- Automatic defect detection in holographic interferograms remains a challenge, often requiring manual analysis.
Purpose of the Study:
- To develop and evaluate a neural network approach for the automatic detection of defects in loaded technical components using holographic interference patterns.
- To define translation- and rotation-invariant features for robust defect identification.
Main Methods:
- A neural network model was trained using a dataset generated by simulating interferograms, guided by experimentally measured samples.
- Translation- and rotation-invariant features were defined based on the maximal local slope of intensity and pattern partitioning.
- The method was tested on practical holographic interference patterns from loaded technical components.
Main Results:
- The developed neural network approach successfully demonstrated the feasibility of automatic defect detection.
- The defined invariant features contributed to the robustness of the detection method.
- Practical results confirmed the effectiveness of the proposed technique for holographic NDT.
Conclusions:
- The neural network approach offers a viable solution for automated defect detection in holographic nondestructive testing.
- The method provides a scalable strategy applicable to various holographic NDT tasks.
- This work advances the automation capabilities in the field of component integrity assessment.

