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Photorefractive integrator characterization.

J H Hong, J B Norman, T Y Chang

|November 10, 2010

Summary

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Researchers characterized bismuth silicon oxide (Bi(12)SiO(20)) photorefractive crystals for adaptive radar processing. Frequency response and dynamic range data were measured to assess their suitability as time-integrating devices.

Area of Science:

Materials Science
Optical Engineering
Electrical Engineering
Signal Processing

Background:

Phased-array radar systems require advanced signal processing for null-steering capabilities.
Optically implemented adaptive processors offer potential advantages in speed and complexity.
Photorefractive crystals are candidates for time-integrating devices in such processors.

Purpose of the Study:

To characterize bismuth silicon oxide (Bi(12)SiO(20)) crystals for use in optical adaptive processors.
To evaluate the suitability of these crystals as time-integrating devices for phased-array radar.
To present key performance metrics including frequency response and dynamic range.

Main Methods:

Characterization of Bi(12)SiO(20) crystals using an acousto-optic apparatus.

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Measurement of crystal frequency response.

Assessment of dynamic range data for candidate crystals.

Main Results:

Frequency response data for Bi(12)SiO(20) crystals were successfully measured.
Dynamic range data for the candidate Bi(12)SiO(20) crystals were presented.
These measurements provide critical insights into the crystals' performance for radar applications.

Conclusions:

The characterization results are essential for the development of optically implemented adaptive processors.
Bi(12)SiO(20) crystals show promise as time-integrating devices for phased-array radar.
Further research will validate their integration into functional null-steering systems.