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Updated: Jun 6, 2026

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Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
Published on: July 5, 2016
Holographic in-plane measurement using reference-wave reconstruction: phase stepping and application to a deformation
Applied Optics
|November 10, 2010
Abstract:
We apply the technique of reference-wave reconstruction to a practical in-plane displacement measurement problem. Even 20 years after its development, the technique remained neglected and unemployed. The phase-stepping feature is introduced by shifting one of the reconstruction waves. The method provides high-contrast fringe maps and allows for monitoring the deformation fields in real time. The results demonstrate the important potential of the technique in the measurement of in-plane displacement components.

