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Electronic Distance Measuring Instruments01:30

Electronic Distance Measuring Instruments

Electronic Distance Measuring Instruments (EDMs) are essential tools in modern surveying, offering precise distance measurements by emitting electromagnetic signals and calculating the time required for these signals to travel to a target and return. Two primary types of signals are used in EDMs — light waves and microwaves — each suited to specific environmental and distance requirements. Light-wave-based EDMs utilize either infrared or laser light, providing high accuracy over short distances...

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Related Experiment Video

Updated: Jun 6, 2026

A Random-displacement Measurement by Combining a Magnetic Scale and Two Fiber Bragg Gratings
08:23

A Random-displacement Measurement by Combining a Magnetic Scale and Two Fiber Bragg Gratings

Published on: September 30, 2019

Integrated microinterferometric sensor for in-plane displacement measurement.

Jerzy Krężel1, Małgorzata Kujawińska, Jürgen Mohr

  • 1Institute of Micromechanics and Photonics, 8 Saint Andrzega Boboli Street, 02-525 Warszawa, Poland. j.krezel@mchtr.pw.edu.pl

Applied Optics
|November 12, 2010
PubMed
Summary
This summary is machine-generated.

This study introduces an integrated grating interferometer (GI) sensor for precise in-plane displacement measurements in large engineering structures. The developed sensor technology enables accurate monitoring of microregions within complex mechanical systems.

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Implementation of a Reference Interferometer for Nanodetection
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Implementation of a Reference Interferometer for Nanodetection

Published on: April 26, 2014

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Last Updated: Jun 6, 2026

A Random-displacement Measurement by Combining a Magnetic Scale and Two Fiber Bragg Gratings
08:23

A Random-displacement Measurement by Combining a Magnetic Scale and Two Fiber Bragg Gratings

Published on: September 30, 2019

Implementation of a Reference Interferometer for Nanodetection
16:11

Implementation of a Reference Interferometer for Nanodetection

Published on: April 26, 2014

Area of Science:

  • Optical Engineering
  • Metrology
  • Materials Science

Background:

  • Accurate displacement measurement is crucial for monitoring the structural integrity of large engineering systems.
  • Existing methods may lack the precision required for microregion analysis in complex structures.

Purpose of the Study:

  • To develop and present an integrated sensor system for in-plane displacement measurement.
  • To detail the design, fabrication, and analysis of a grating interferometer (GI) based sensor head (MH).

Main Methods:

  • System design based on a monolithic grating interferometer (GI).
  • Fabrication of the measurement head (MH) using master fabrication and hot embossing replication.
  • Numerical analysis including geometric ray tracing and scalar wave propagation.
  • Demonstrative measurement using a sensor model.

Main Results:

  • Detailed description of the GI sensor concept and monolithic design.
  • Characterization of the technology chain for MH fabrication.
  • Determination of geometrical tolerances and optical quality requirements for beam guiding.
  • Successful demonstrative measurement validating the sensor's capability.

Conclusions:

  • The integrated grating interferometer sensor offers a viable solution for in-plane displacement measurement in microregions.
  • The presented technology chain and numerical analysis provide a pathway for robust sensor head fabrication.
  • The demonstrative measurement confirms the sensor's potential for practical applications in large engineering structures.