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Updated: Jun 6, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on: May 10, 2021
A facile approach for quantifying the density of defects (edge plane sites) of carbon nanomaterials and related
Philip M Hallam1, Craig E Banks
1Faculty of Science and Engineering, School of Biology, Chemistry and Health Science, Division of Chemistry and Materials, Manchester Metropolitan University, Chester Street, Manchester M1 5GD, Lancs, UK.
Abstract:
A facile methodology based on cyclic voltammetry is presented allowing the density of defects, viz edge plane like-sites/defects of carbon nanomaterials to be readily quantified. The approach is based on the construction of carbon nanomaterial paste electrodes which is measured using cyclic voltammetry and a standard electrochemical redox probe. This protocol allows a quantitative relationship between the heterogeneous electron-transfer rate and the density of defects to be readily determined and also provides researchers with a methodology to quantify the density of defects for comparative purposes.
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