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Updated: Jun 6, 2026

Lensfree On-chip Tomographic Microscopy Employing Multi-angle Illumination and Pixel Super-resolution
Published on: August 16, 2012
Refractive-index measurement of gradient-index microlenses by diffraction tomography
Abstract:
Diffraction tomography is applied to reconstruction of the gradient-index distribution of planar gradient-index microlenses, fabricated by thermal ion exchange. Measurements of the single-phase projections are performed by phase-shifting interferometry For reconstruction, the Rytov approximation for smooth inhomogeneities is applied. Results are compared with measurement results from other methods and simulation results.
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