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Scanning Electron Microscopy

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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Related Experiment Video

Updated: Jun 6, 2026

Scattering And Absorption of Light in Planetary Regoliths

Scattering And Absorption of Light in Planetary Regoliths

Published on: July 1, 2019

Scattering by random particles on optical surfaces.

W M Bruno, J S Bessey, P M Whitesmith

|November 19, 2010

Summary

This summary is machine-generated.

A new analytical technique accurately calculates light scattering from surface contaminants. This method, validated by comparing measured and predicted bidirectional reflectance distribution function (BRDF) values, offers reliable surface analysis.

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Last Updated: Jun 6, 2026

Scattering And Absorption of Light in Planetary Regoliths

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Optical Scatter Microscopy Based on Two-Dimensional Gabor Filters

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Published on: June 2, 2010

Area of Science:

Optics
Surface Science
Materials Science

Background:

Surface contamination can significantly alter optical properties.
Accurate characterization of light scattering from contaminants is crucial for quality control and performance prediction.

Purpose of the Study:

To develop and validate an analytical technique for calculating angle-resolved light scattering by contaminant particles on smooth opaque surfaces.

Main Methods:

Developed an analytical method to calculate light scattering.
Utilized scanning electron microscopy and a Princeton gamma-tech image analyzer to obtain particle characteristics (size, shape, areal density).
Measured and calculated bidirectional reflectance distribution function (BRDF) values for comparison.

Main Results:

The analytical method was tested by comparing measured and calculated BRDF values.
Calculated BRDF values showed good agreement with measured values across most scattering angles.
Agreement was within the uncertainty limits of the particle characterization process.

Conclusions:

The developed analytical technique provides a reliable method for predicting light scattering from surface contaminants.
This technique can be valuable for assessing the impact of contamination on optical performance.
Further refinement may improve accuracy by reducing particle characterization uncertainty.