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Electronic Distance Measuring Instruments

Electronic Distance Measuring Instruments

Electronic Distance Measuring Instruments (EDMs) are essential tools in modern surveying, offering precise distance measurements by emitting electromagnetic signals and calculating the time required for these signals to travel to a target and return. Two primary types of signals are used in EDMs — light waves and microwaves — each suited to specific environmental and distance requirements. Light-wave-based EDMs utilize either infrared or laser light, providing high accuracy over short distances...

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Related Experiment Video

Updated: Jun 6, 2026

Characterizing Far-infrared Laser Emissions and the Measurement of Their Frequencies

Characterizing Far-infrared Laser Emissions and the Measurement of Their Frequencies

Published on: December 18, 2015

Distance measurements using two frequency-stabilized Nd:YAG lasers.

V Mahal, A Arie

|November 19, 2010

Summary

This study introduces a stable two-wavelength interferometry system using Nd:YAG lasers locked to molecular transitions for precise distance measurements. The system achieves high accuracy by leveraging a tunable synthetic wavelength, enabling large nonambiguity ranges.

Area of Science:

Laser Physics
Metrology
Spectroscopy

Background:

Accurate distance measurements are crucial in various scientific and industrial applications.
Traditional interferometry methods face limitations in range and accuracy.
Molecular spectroscopy offers stable frequency references for laser systems.

Purpose of the Study:

To develop a highly stable and accurate two-wavelength interferometry system.
To enable precise distance measurements over a large nonambiguity range.
To utilize molecular transitions for robust laser frequency stabilization.

Main Methods:

Employing two diode-pumped tunable Neodymium-doped Yttrium Aluminum Garnet (Nd:YAG) lasers.
Locking laser frequencies to sub-Doppler transitions of iodine-127 (I2) and cesium-133 (Cs2).

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Last Updated: Jun 6, 2026

Characterizing Far-infrared Laser Emissions and the Measurement of Their Frequencies

Characterizing Far-infrared Laser Emissions and the Measurement of Their Frequencies

Published on: December 18, 2015

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Implementation of a Reference Interferometer for Nanodetection

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Utilizing fringe contrast and phase-shifting techniques for synthetic phase measurement.

Main Results:

Achieved a highly stable and accurate synthetic wavelength (Λ) ranging from 8.5 mm to over 1 m.
Demonstrated distance measurement accuracy of 70 µm for Λ ≈ 19 mm.
Obtained a phase interpolation accuracy of Λ/260.

Conclusions:

The developed two-wavelength interferometry system provides a robust platform for precise metrology.
The use of molecular absorbers allows for flexible selection of synthetic wavelengths, enhancing measurement versatility.
This technique significantly improves the nonambiguity range for distance measurements.