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Fabrication of Gate-tunable Graphene Devices for Scanning Tunneling Microscopy Studies with Coulomb Impurities
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Published on: July 24, 2015

Structural defects in graphene

Florian Banhart1, Jani Kotakoski, Arkady V Krasheninnikov

  • 1Institut de Physique et Chimie des Matériaux, UMR 7504 CNRS, Université de Strasbourg, 23 rue du Loess, 67034 Strasbourg, France. banhart@ipcms.u-strasbg.fr

ACS Nano
|November 25, 2010
PubMed

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