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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

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[New approaches to development of high-performance X-ray sources based on nanomaterials]

S V Alekseev, D N Ignat'ev, M L Taubin

    Meditsinskaia Tekhnika
    |November 30, 2010
    PubMed
    Abstract

    No abstract available in PubMed .

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