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Updated: Jun 6, 2026
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A Random-displacement Measurement by Combining a Magnetic Scale and Two Fiber Bragg Gratings
Published on: September 30, 2019
Position determination of scatter signatures--a novel sensor geometry
Anthony Dicken1, Keith Rogers, Paul Evans
1Department of Translational Medicine, Cranfield Health, Cranfield University, Shrivenham, Swindon SN6 8LA, UK. a.dicken@cranfield.ac.uk
Talanta
|November 30, 2010
Summary
A new diffraction sensor geometry identifies unknown materials and their locations without prior knowledge. This advanced X-ray technique can analyze multiple overlapped materials, enhancing security screening.
Area of Science:
- Materials Science
- Analytical Chemistry
- Physics
Background:
- Accurate material identification is crucial for security applications.
- Current diffraction methods often require known sample positioning.
- Overlapping materials present a significant challenge in analysis.
Purpose of the Study:
- To introduce a novel diffraction sensor geometry for material analysis.
- To enable identification of unknown materials without prior location data.
- To resolve diffraction patterns from multiple, overlapped materials.
Main Methods:
- Development of a unique diffraction sensor geometry.
- Utilizing Bragg peak maxima tracking.
- Employing a series of X-ray detector positions.
- Verification through simulations and experimental studies.
Main Results:
- Demonstrated ability to provide diffraction patterns of unknown materials.
- Successfully resolved diffraction from multiple overlapped materials.
- Confirmed linear propagation of Bragg peaks from the inspection volume.
Conclusions:
- The novel sensor geometry effectively characterizes unknown materials, even when overlapped.
- This technique offers significant potential for security applications.
- Applications include airport screening and postal system drug trafficking detection.
