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Fabrication and Testing of Photonic Thermometers
Published on: October 24, 2018
Miniature 10 kHz thermo-optic delay line in silicon
Eduardo Margallo-Balbás1, Max Geljon, Grégory Pandraud
1Medlumics S.L., Paseo de la Florida 16 6G, 28008 Madrid, Spain. e.margallo@medlumics.com
Optics Letters
|December 3, 2010
Summary
Researchers developed a rapid silicon scanning delay line for optical coherence tomography. This integrated optics device achieves 10 kHz scan rates and a 0.95 mm scan range without resolution loss.
Area of Science:
- Photonics
- Optical Engineering
- Biomedical Optics
Background:
- Scanning delay lines are crucial for time-domain optical coherence tomography (TD-OCT).
- Current delay lines face limitations in speed, size, cost, and integrated optics compatibility.
- Advancements are needed for more efficient and compact TD-OCT systems.
Purpose of the Study:
- To report a novel, rapid scanning delay line for TD-OCT systems.
- To demonstrate the feasibility of silicon thermo-optic effect for integrated delay lines.
- To overcome limitations of existing scanning delay line technologies.
Main Methods:
- Utilized the thermo-optic effect of silicon at a wavelength of 1.3 μm.
- Manufactured the device using generic planar lightwave circuit technology.
- Integrated the scanning delay line into a TD-OCT system for testing.
Main Results:
- Achieved high line scan rates of 10 kHz.
- Demonstrated a substantial scan range of 0.95 mm.
- Maintained resolution (15 µm FWHM) without degradation due to depth-dependent chromatic dispersion.
Conclusions:
- The silicon thermo-optic scanning delay line is a viable solution for high-speed TD-OCT.
- This integrated optics approach offers a compact and potentially lower-cost alternative.
- The technology shows promise for next-generation OCT systems.
