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Related Concept Videos

X-ray Diffraction of Biological Samples01:10

X-ray Diffraction of Biological Samples

X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are  scattered by the electron clouds around the sample atoms. The  X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal crystal...
X-ray Crystallography02:18

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
Determination of Crystal Structures01:29

Determination of Crystal Structures

In the late 1800s, the revelation that light extended beyond visible wavelengths led to the discovery of X-rays by Wilhelm Roentgen. Recognized as high-energy electromagnetic radiation with short wavelengths, X-rays prompted exploration into their interaction with crystals. Max von Laue proposed in 1912 that the periodic arrangement of atoms, ions, or molecules in crystals would cause them to diffract X-rays, a hypothesis confirmed through experiments with copper sulfate and zinc sulfide...

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Related Experiment Video

Updated: Jun 6, 2026

Stress Distribution During Cold Compression of Rocks and Mineral Aggregates Using Synchrotron-based X-Ray Diffraction
10:36

Stress Distribution During Cold Compression of Rocks and Mineral Aggregates Using Synchrotron-based X-Ray Diffraction

Published on: May 20, 2018

Probing deformation substructure by synchrotron X-ray diffraction and dislocation dynamics modelling.

Alexander M Korsunsky1, Felix Hofmann, Xu Song

  • 1Department of Engineering Science, University of Oxford, Oxford OX1 3PJ, UK.

Journal of Nanoscience and Nanotechnology
|December 8, 2010
PubMed
Summary
This summary is machine-generated.

Advanced synchrotron X-ray techniques enable nano-scale materials characterization, revealing deformation behaviors and material properties. These methods bridge experimental data and computational modeling for improved material design and understanding.

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Related Experiment Videos

Last Updated: Jun 6, 2026

Stress Distribution During Cold Compression of Rocks and Mineral Aggregates Using Synchrotron-based X-Ray Diffraction
10:36

Stress Distribution During Cold Compression of Rocks and Mineral Aggregates Using Synchrotron-based X-Ray Diffraction

Published on: May 20, 2018

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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
13:58

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

Published on: September 28, 2016

Area of Science:

  • Materials Science
  • Condensed Matter Physics
  • Nanotechnology

Background:

  • Nano-structured materials exhibit unique properties driven by nanoscale mechanisms.
  • Characterizing these materials requires techniques that resolve structures and deformation at the nanoscale.

Purpose of the Study:

  • To review and discuss advanced synchrotron X-ray techniques for nano-scale materials characterization.
  • To explore the integration of experimental results with computational modeling for improved material analysis.

Main Methods:

  • High-resolution synchrotron X-ray diffraction for crystal structure, strain, and texture analysis.
  • Small-angle X-ray scattering for analyzing nanoscale voids and defects.
  • X-ray imaging techniques like radiography and tomography.
  • Integration with finite-element and discrete dislocation simulations.

Main Results:

  • Synchrotron X-ray beams offer high resolution, tunability, and brightness for detailed materials analysis.
  • Experimental data can be configured to validate and refine computational models.
  • Post-processing of simulation results facilitates direct comparison with experimental findings.

Conclusions:

  • Synchrotron-based techniques are powerful tools for nano-scale materials characterization.
  • Combining these experiments with advanced modeling provides deeper insights into material behavior.
  • This integrated approach aids in understanding and designing novel nano-structured materials.