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Related Experiment Video

Updated: Jun 5, 2026

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
09:32

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Published on: January 26, 2016

Internal reflection ellipsometry in air and water ambient.

Soichi Otsuki1, Mitsuru Ishikawa

  • 1Health Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Hayashi-cho, Takamatsu, Kagawa 761-0395, Japan. otsuki-so@aist.go.jp

Optics Letters
|December 18, 2010
PubMed
Summary

Internal reflection ellipsometry (IRE) accurately measured thin film properties like refractive indices and thicknesses in air and water. This technique is effective for analyzing films on transparent substrates, especially at liquid interfaces.

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Area of Science:

  • Materials Science
  • Optics
  • Surface Science

Background:

  • Accurate characterization of thin films is crucial for various applications.
  • Analyzing thin films at liquid interfaces presents unique challenges.
  • Ellipsometry is a powerful optical technique for thin film analysis.

Purpose of the Study:

  • To evaluate the efficacy of internal reflection ellipsometry (IRE) for thin film characterization.
  • To assess IRE's performance in different ambient conditions (air and water).
  • To validate IRE for analyzing thin films at transparent substrate-liquid interfaces.

Main Methods:

  • Multilayer samples were measured using internal reflection ellipsometry (IRE).
  • Measurements were conducted in both air and water ambients below the critical angle of incidence.
  • Data analysis involved fitting to determine refractive indices and layer thicknesses, varying incident angle and wavelength.

Main Results:

  • IRE measurements yielded refractive indices and thicknesses consistent with theoretical values.
  • The technique proved effective for analyzing multilayer samples.
  • Successful characterization was achieved in both air and water environments.

Conclusions:

  • Internal reflection ellipsometry (IRE) is a reliable method for measuring thin film properties.
  • IRE is particularly effective for studying thin films at transparent substrate-liquid interfaces.
  • The study validates IRE as a valuable tool for thin film analysis in diverse environments.