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Quantifying the stress relaxation modulus of polymer thin films via thermal wrinkling
Edwin P Chan1, Santanu Kundu, Qinghuang Lin
1Polymers Division, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899, USA.
Abstract:
The viscoelastic properties of polymer thin films can have a significant impact on the performance in many small-scale devices. In this work, we use a phenomenon based on a thermally induced instability, termed thermal wrinkling, to measure viscoelastic properties of polystyrene films as a function of geometric confinement via changes in film thickness. With application of the appropriate buckling mechanics model for incompressible and geometrically confined films, we estimate the stress-relaxation modulus of polystyrene films by measuring the time-evolved wrinkle wavelength at fixed annealing temperatures. Specifically, we use time-temperature superposition to shift the stress relaxation curves and generate a modulus master curve for polystyrene films investigated here. On the basis of this master curve, we are able to identify the rubbery plateau, terminal relaxation time, and viscous flow region as a function of annealing time and temperatures that are well-above its glass transition. Our measurement technique and analysis provide an alternative means to measure viscoelastic properties and relaxation behavior of geometrically confined polymer films.
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