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UV–Vis Spectrometers01:14

UV–Vis Spectrometers

The absorbance of UV and visible (UV–visible) radiations is measured using a UV–visible spectrophotometer. Deuterium lamps, which emit UV radiation, and tungsten lamps, which produce radiation in the visible region, are used as light sources in UV–visible spectrophotometers. A monochromator or prism is used for diffraction grating, i.e., to split the incoming radiation into different wavelengths. A system of slits is used to focus the desired wavelength on the sample cell. Samples for...
IR Spectrometers01:25

IR Spectrometers

There are two main infrared (IR) spectrophotometers: dispersive IR spectrometers and Fourier transform infrared (FTIR) spectrometers. In a dispersive IR spectrometer, a beam of infrared radiation produced by a hot wire is divided into two parallel equal-intensity beams using mirrors. One beam passes through the sample, while another is a reference beam. The beams then move through the monochromator, which separates the radiations into a continuous spectrum of different frequencies. The...
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

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Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
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Spectrophotometry: Introduction01:16

Spectrophotometry: Introduction

Spectrophotometry is the quantitative measurement of the absorption, reflection, diffraction, or transmission of electromagnetic radiation through a material as a function of the intensity and wavelength of the radiation. A spectrophotometer is a device used to measure the change in the radiation intensity caused by its interaction with the material.
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Raman Spectroscopy Instrumentation: Overview01:26

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A conventional Raman spectrophotometer includes a laser source, a sample holding system, a wavelength selector, and a detector.
The monochromatic laser source, typically using visible or near-infrared radiation, generates a highly focused beam of light. This light interacts with the molecules of the sample, scattering some of the light. Liquid and gaseous samples are usually tested in ordinary glass capillaries, while solids can be analyzed as powders packed in capillaries or as potassium...
Attenuated Total Reflectance (ATR) Infrared Spectroscopy: Overview01:13

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Attenuated total reflectance (ATR) infrared spectroscopy is a powerful analytical technique used to study the composition of materials. It is widely employed in chemistry, materials science, forensic science, and other fields where sample characterization is required. ATR has several advantages over traditional transmission IR spectroscopy, including the requirement of little to no sample preparation and the ability to analyze a wide range of samples.
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Related Experiment Video

Updated: Jun 5, 2026

High Speed Sub-GHz Spectrometer for Brillouin Scattering Analysis
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Published on: December 22, 2015

Spectroscopic null ellipsometer using a variable retarder.

Lionel R Watkins1, Sophie S Shamailov

  • 1Department of Physics, University of Auckland, P.B. 92019, Auckland, New Zealand. l.watkins@auckland.ac.nz

Applied Optics
|January 12, 2011
PubMed
Summary
This summary is machine-generated.

This study introduces a novel polarizer-compensator-sample-analyzer (PCSA) null ellipsometer using a variable retarder. This new method accurately determines thin film thicknesses, matching traditional techniques.

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Area of Science:

  • Optics and Photonics
  • Materials Science
  • Surface Analysis

Background:

  • Ellipsometry is a powerful technique for characterizing thin films.
  • Traditional PCSA null ellipsometers often use fixed compensators, limiting flexibility.
  • Developing adaptable ellipsometry systems is crucial for advanced material analysis.

Purpose of the Study:

  • To present a modified polarizer-compensator-sample-analyzer (PCSA) null ellipsometer design.
  • To demonstrate the direct determination of ellipsometric angles using a variable retarder.
  • To validate the accuracy of this new system for thin film thickness measurements.

Main Methods:

  • Utilized a variable retarder, specifically a Soleil-Babinet compensator with quartz plates, as the compensator in a PCSA setup.
  • Maintained a fixed azimuthal angle for either the polarizer or analyzer.
  • Calculated retarder delay at various wavelengths using dispersion data and a reference measurement at 632.8 nm.

Main Results:

  • Successfully implemented a PCSA null ellipsometer with a variable retarder.
  • Ellipsometric angles (ψ and Δ) were directly determined from the rotating component's azimuth and compensator delay.
  • Accurate thickness measurements of silicon dioxide films on silicon wafers were achieved, consistent with traditional methods.

Conclusions:

  • The developed variable retarder-based PCSA null ellipsometer offers a viable and accurate alternative for thin film characterization.
  • This method simplifies data acquisition by directly relating angles to physical parameters.
  • The system demonstrates excellent agreement with established ellipsometric techniques, highlighting its reliability.