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Polarization-Sensitive Two-Photon Microscopy for a Label-Free Amyloid Structural Characterization
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Image blur and energy broadening effects in XPEEM

Andrea Locatelli1, Tevfik Onur Menteş, Miguel Ángel Niño

  • 1Elettra - Sincrotrone Trieste S.C.p.A., 34149 Basovizza, Trieste, Italy. andrea.locatelli@elettra.trieste.it

Ultramicroscopy
|January 15, 2011
PubMed

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