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Characterization of Synthetic Polymers via Matrix Assisted Laser Desorption Ionization Time of Flight (MALDI-TOF) Mass Spectrometry
Published on: June 10, 2018
Calibrated NEXAFS spectra of common conjugated polymers
B Watts1, S Swaraj, D Nordlund
1North Carolina State University, Raleigh, North Carolina 27695, USA. benjamin.watts@psi.ch
The Journal of Chemical Physics
|January 19, 2011
Summary
Near edge x-ray absorption fine structure (NEXAFS) spectroscopy is vital for analyzing polymers in organic electronics. This study provides essential reference spectra for accurate material characterization and device development.
Area of Science:
- Materials Science
- Spectroscopy
- Polymer Chemistry
Background:
- Near edge x-ray absorption fine structure (NEXAFS) spectroscopy is a key technique for characterizing polymeric materials.
- Its application is growing in organic electronic devices for analyzing thin films.
- Accurate compositional analysis and orientation assessment require reliable reference spectra.
Purpose of the Study:
- To provide a comprehensive set of reference NEXAFS spectra.
- To support quantitative analysis of semiconducting polymers.
- To aid in understanding molecular orientation in organic electronic materials.
Main Methods:
- Acquisition of NEXAFS spectra.
- Characterization of 23 semiconducting polymers and related materials.
- Ensuring known energy resolution and calibrated energy scale for spectra.
Main Results:
- A curated dataset of NEXAFS spectra from diverse semiconducting polymers.
- Spectra suitable for detailed electronic structure and orientation analysis.
- Facilitation of reliable quantitative compositional analysis.
Conclusions:
- The provided reference spectra are crucial for advancing organic electronic device research.
- This dataset enhances the utility of NEXAFS spectroscopy for polymer characterization.
- Enables more accurate material assessment and device performance prediction.
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