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Updated: Dec 24, 2025

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
A versatile Johansson-type tender x-ray emission spectrometer.
S H Nowak1, R Armenta1, C P Schwartz1
1SLAC National Accelerator Laboratory, 2575 Sand Hill Rd., Menlo Park, California 94025, USA.
A new high-resolution X-ray spectrometer achieves subnatural line-width energy resolution for tender X-rays. This versatile instrument enables advanced in situ studies of various sample types.
Area of Science:
- Materials Science
- Spectroscopy
- Synchrotron Radiation
Background:
- High energy resolution X-ray spectroscopy is crucial for materials characterization.
- Existing instruments often face limitations in resolution or sample environment versatility.
Purpose of the Study:
- To design and demonstrate a novel high-resolution X-ray spectrometer for the tender X-ray regime.
- To achieve subnatural line-width energy resolution for versatile in situ measurements.
Main Methods:
- Development of a spectrometer based on Rowland geometry with cylindrically bent Johansson analyzers.
- Integration of a position-sensitive detector and a versatile sample chamber within a vacuum environment.
- Operation in an energy-dispersive mode with sample placement inside the Rowland circle.
Main Results:
- Achieved subnatural line-width energy resolution of approximately 0.32 eV at 2400 eV.
- Demonstrated performance with an extended incident X-ray beam across a wide range of diffraction angles (30°–65°).
- Enabled versatile sample environments including solid, gas, liquid, in situ cells, and radioactive materials.
Conclusions:
- The developed spectrometer offers unprecedented energy resolution in the tender X-ray range.
- Its versatile sample environment facilitates advanced in situ studies.
- The instrument is well-suited for detailed investigations in materials science and related fields.
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